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Surface Analysis by Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1997, v.10 no.5, pp.1087-1104
Lee,
Y., &
Han,
S.
(1997). Surface Analysis by Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS). Analytical Science and Technology, 10(5), 1087-1104.
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