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A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory

Journal of The Korea Internet of Things Society / Journal of The Korea Internet of Things Society, (P)2799-4791;
2021, v.7 no.4, pp.9-14
https://doi.org/https://doi.org/10.20465/kiots.2021.7.4.009

Abstract

In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.

keywords
낸드 플래시 메모리, 불량 발생 예측, 수명 예측 최적화, 저장시스템, 빅데이터 분석, Nand flash memory, Prediction of occurrence of deffects, Optimizing lifetime prediction., Storage system, Big data analysis

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Journal of The Korea Internet of Things Society