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  • P-ISSN 2233-4203
  • E-ISSN 2093-8950

Generation of Water Droplet Ion Beam for ToF-SIMS Analysis

Mass Spectrometry Letters / Mass Spectrometry Letters, (P)2233-4203; (E)2093-8950
2023, v.14 no.4, pp.147-152
https://doi.org/10.5478/MSL.2023.14.4.147
Choi Myoung Choul (Korea Basic Science Institute)
Baek Ji Young (Korea Basic Science Institute)
Hong Aram (Korea Basic Science Institute)
Eo Jae Yeong (Korea Basic Science Institute)
Choi Chang Min (Korea Basic Science Institute)
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Abstract

The increasing demand for two-dimensional imaging analysis using optical or electronic microscopic techniques has led to an increase in the use of simple one-dimensional and two-dimensional mass spectrometry imaging. Among these imaging methods, secondary-ion mass spectrometry (SIMS) has the best spatial resolution using a primary ion beam with a relatively insignificant beam diameter. Until recently, SIMS, which uses high-energy primary ion beams, has not been used to analyze mole- cules. However, owing to the development of cluster ion beams, it has been actively used to analyze various organic molecules from the surface. Researchers and commercial SIMS companies are developing cluster ion beams to analyze biological samples, includ- ing amino acids, peptides, and proteins. In this study, a water droplet ion beam for surface analysis was realized. Water droplets ions were generated via electrospraying in a vacuum without desolvation. The generated ions were accelerated at an energy of 10 keV and collided with the target sample, and secondary ion mass spectra were obtained for the generated ions using ToF-SIMS. Thus, the proposed water droplet ion-beam device showed potential applicability as a primary ion beam in SIMS.

keywords
Mass Spectrometry imaging, ToF-SIMS, Primary ion beam, Water droplet ion beam


Submission Date
2023-09-19
Revised Date
2023-11-05
Accepted Date
2023-11-10
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Mass Spectrometry Letters