- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
Article Detail
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Surface Analysis of Modified Polymer Samples by X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1994, v.7 no.3, pp.301-313
Park,
S., Kim,
D., Kim,
Y., Park,
B., Han,
W., &
Suh,
B.
(1994). Surface Analysis of Modified Polymer Samples by X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy. Analytical Science and Technology, 7(3), 301-313.
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Abstract
X-Ray Photoelectron Spectroscopy(XPS) and Rutherford Backscattering Spectroscopy(RBS) are used for the analysis of additives, examination of chemical structure and determination of identity with qualitative and quantitative analysis of surface elements, binding energy level and depth profiling in the surface. We analyzed surface of polyethylene, acrylonitrile butadien rubber, polypropylene, glass, fiber and paper treated with <TEX>$XeF_2$</TEX> or C-F plasma by XPS and RBS. It was found that fluoro element was penetrated to sample surface and the distribution of surface elements are different than untreated samples.
- keywords
- X-Ray Photoelectron Spectroscopy and Rutherford Backscattering Spectroscopy, surface analysis
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