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- E-ISSN 2288-8985
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- P-ISSN1225-0163
- E-ISSN2288-8985
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Low-level Determinations of Uranium and Thorium in Geologic Samples by X-ray Fluorescence
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1996, v.9 no.1, pp.20-25
Park,
Y. J., Kim,
J. S., Choi,
K. S., &
Suh,
M.
Y.
(1996). Low-level Determinations of Uranium and Thorium in Geologic Samples by X-ray Fluorescence. Analytical Science and Technology, 9(1), 20-25.
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Abstract
Trace levels of uranium and thorium in geologic samples are determined rapidly by a direct wavelength-dispersive X-ray fluorescence method. Relative intensity of scattered tube radiation was used as an internal standard to compensate for variations in instrumental operating characteristics. U and Th can be determined within a precision of <TEX>${\pm}10%$</TEX> and accuracy of <TEX>${\pm}15%$</TEX> or less with measuring times of 50 seconds for Th and 400 seconds for U, respectively. The results of XRF analysis were in good agreement with those of other methods such as nutron activation analysis and inductively coupled plasma atomic emission spectrometry.
- keywords
- X-ray fluorescence, Uranium, Thorium, Geologic materials
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