- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
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Studies on effects of calibration methods and current lead position on the direct current potential drop method for crack length measurement
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1997, v.10 no.4, pp.300-306
Cho,
C., Kim,
I., Kim,
S., Choe,
S., &
Hur,
B.
(1997). Studies on effects of calibration methods and current lead position on the direct current potential drop method for crack length measurement. Analytical Science and Technology, 10(4), 300-306.
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Abstract
The effective resolution of the direct current potential drop (DCPD) method for crack length determination is strongly affected by a number of factors including wire locations and calibration method. In the present study, the effects of wire locations, thermal EMF and reference probe locations on the accuracy of calibration methods, including Hicks-Pickard equation and Johnson's equation, were examined with the CT specimens which were nine times larger than the standard specimen. In light of experimental results, it was found that Hicks-Pickard equation can accurately represent the a/W-V/Vo relationship when current input wire is located at the load line. It was also found that the accuracy of DCPD method can be greatly improved with the thermal EMF calibration and the use of Vo value at a/W
- keywords
- DCPD method, thermal EMF, reference voltage
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