Article Detail

Home > Article Detail
  • P-ISSN 1225-0163
  • E-ISSN 2288-8985

EPMA Analysis of Inter-reaction Layer in Irradiated U3Si-Al Fuels

Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
2004, v.17 no.4, pp.355-362





  • Downloaded
  • Viewed

Abstract

Fission products and Inter reaction layer of U3Si-Al dispersion fuel, irradiated in HANARO research reactor with 121 kW/m of maximum liner power and 63 at% of average burn-up, was characterization by EPMA (Electron Probe Micro Analyzer). The fuel punching system developed by Irradiated Materials Examination Facility (IMEF) has used to make these samples for the EPMA. With this system a very small and thin specimen which is 1.57 mm in diameter and 2 mm in thickness respectively has been fabricated to protect the EPMA operator from high radioactive fuel and to minimize the equivalent dose rate less than 150 mSv/h. EPMA was performed to observe layers of sectional, Inter-reaction and oxide with specimens of cutting and polished. Stoichiometry in the Inter-reaction layer with 16 ㎛ of thickness was U2.84 Si Al14 with calibration of UO2 and U3.24 Si Al14.1 with calibration of standard specimen. metallic precipitates in this layer were not observed using fission products examination.

keywords
EPMA, nuclear fuel, post irradiation examination, <TEX>$U_3Si/Al$</TEX> fuel


Reference

1

(2001) Post Irradiation Examination of Mini-Plate Nuclear Fuel, KAERI/TR-1896, KAER

2

(2001) Post Irradiation Examination of HANARO Nuclear Mini-Element Fuel" KAERI/TR-1836, KAERI

3

(2000) Irradiated U3Si Fuel EPMA Quantitative, KAERI

4

(1991) Micro structural Features of SIMFUEL,

5

(2001) Characterization of Irradiated SIMFUEL,

6

(2003) EPMA Analysis of non-coated UO2 pellet" KAERI/TR-2579, KAERI

7

(2001) Post Irradiation Examination of HANARO Nuclear Mini-Element Fuel" KAERI/TR-1836, KAERI

8

(2001) Post Irradiation Examination of HANARO Nuclear Mini-Element Fuel" KAERI/TR-1836, KAERI

상단으로 이동

Analytical Science and Technology