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Determination of Trace Silicon in Uranium Dioxide by UV-VIS Spectrophometry
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
2008, v.21 no.5, pp.397-402
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(2008). Determination of Trace Silicon in Uranium Dioxide by UV-VIS Spectrophometry. Analytical Science and Technology, 21(5), 397-402.
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Abstract
이산화우라늄을 질산 및 미량의 불산으로 녹인 다음 우라늄 매트릭스로부터 규소를 분리하지 않 고 분광광도계(spectrophotometer)로 측정할 수 있는 분석조건을 검토하였다. 분광광도계로 미량의 규소 를 측정할 때 미량의 불산이 규소 분석에 미치는 영향을 조사하였으며, 불산의 간섭을 방지하기 위하여 붕산을 사용하였다. 우라늄 용액에서 미량의 불산이 존재할 경우 포화붕산 사용 유무에 따른 규소의 회 수율은 각각 103.3±0.8 및 76.6±6.8%이었다. 포화붕산의 양은 규소의 회수율에 크게 영향을 미치지 않았 다. 따라서 본 방법으로 이산화우라늄 분말 중의 불순물로 존재하는 미량의 규소를 분리 과정없이 바로 UV-VIS 분광광도법으로 정량할 수 있었다.
- keywords
- uranium dioxide, silicon, saturated boric acid, spectrophotometry
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