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  • P-ISSN 1225-0163
  • E-ISSN 2288-8985

Transmission Electron Microscopy of GaAs Planar Defects

Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1992, v.5 no.1, pp.121-126
Cho, N.H.
Hong, Kug Sun
Cater, C.B.
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Abstract

Transmission electron microscopy was used to investigate the structure of GaAs <TEX>${\Sigma}

keywords
Transmission electron microscopy, GaAs, Planar defects


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