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- E-ISSN 2288-8985
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Transmission Electron Microscopy of GaAs Planar Defects
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1992, v.5 no.1, pp.121-126
Cho,
N., Hong,
K. S., &
Cater,
C.
(1992). Transmission Electron Microscopy of GaAs Planar Defects. Analytical Science and Technology, 5(1), 121-126.
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Abstract
Transmission electron microscopy was used to investigate the structure of GaAs <TEX>${\Sigma}
- keywords
- Transmission electron microscopy, GaAs, Planar defects
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