- P-ISSN 1225-0163
- E-ISSN 2288-8985
휴대형 형광 분석기의 개발을 위한 사전 기초연구로서 탁상형 및 휴대형 X-선 형광분석기를 이용하여 플라스틱 중의 Cd, Pb, Hg, Cr (IV), polybrominated biphenyls (PBB) 및 polybrominated diphenyl ethers (PBDE)의 RoHS 규제 물질에 대하여 비교 분석하였다. 규제 물질이 0~1,200 mg/kg의 농도로 함유된 폴리에틸렌 및 폴리프로필렌 인증표준물질을 사용하여 측정시간에 따른 최적의 분석 조건을 확립하고, 각 규제 물질의 검량곡선을 작성하였다. 플라스틱 인증표준물질과 시료 중의 Pb, Hg, Cd, 총 Cr 및총 Br 함량을 탁상형 X-선 형광분석기의 empirical (EM) 법 및 fundamental parameter (FP) 법으로 정량분석하고 그 결과를 휴대형 X-선 형광분석기와 비교 하였다
As a basic research for development of the domestic portable XRF spectrometer, we discussed the analytical results of bench-top and portable XRF methods for RoHS materials of the Cd, Pb, Hg, Cr(IV),polybrominated biphenyls(PBB) and polybrominated diphenyl ehters(PBDE). The instrumental parameters such as measurement time of bench-top and portable XRF were optimized using certified reference materials of polyethylene and polypropylene with 5 hazardous materials of 0~1,200 mg/kg. The quantitative analysis of total-Cr, total-Br, Cd, Hg and Pb in certified reference materials and plastic samples were compared by empirical method, fundamental parameter method of bench-top XRF and portable XRF.
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