- P-ISSN 1225-0163
- E-ISSN 2288-8985
As a basic research for development of the domestic portable XRF spectrometer, we discussed the analytical results of bench-top and portable XRF methods for RoHS materials of the Cd, Pb, Hg, Cr(IV),polybrominated biphenyls(PBB) and polybrominated diphenyl ehters(PBDE). The instrumental parameters such as measurement time of bench-top and portable XRF were optimized using certified reference materials of polyethylene and polypropylene with 5 hazardous materials of 0~1,200 mg/kg. The quantitative analysis of total-Cr, total-Br, Cd, Hg and Pb in certified reference materials and plastic samples were compared by empirical method, fundamental parameter method of bench-top XRF and portable XRF.
1. Directive 2002/95/EG: Restriction of the Use of Certain hazardous Substances in Electrical and Electronic Equipment (RoHS).
2. C. Mans, S. Hanning, C. Simons, A. Wagner, A. Jan- βen, and M. Kreyenschmidt, Spectrochimica Acta Part B, 62, 116-122 (2007).
3. M. Pöhlein, A. S. Llopis, M. Wolf, and R. van Eldik, J. Chromatogr. A, 1066, 111-117(2005).
4. E. E. Ferg and N. Rust, Polym. Test., 26, 1001-014 (2007).
5. A. H. Hu, C. W. Hsu, T. C. Kuo and W. C. Wu, Expert Systems with Applications, 36, 7142-147(2009).
6. E. Dimitrakakis, A. Janz, B. Bilitewski and E. Gidarakos, Waste Manage. 29, 2700-706(2009).
7. E. Dimitrakakis, A. Janz, B. Bilitewski and E. Gidarakos, J. Hazard. Mater., 161, 913-19(2009).
8. IEC 62321 RoHS Test Method.
9. F. L. Melquiades and C. R. Appoloni, J. Radioanal. Nucl. Chem., 262, 533-541(2004).
10. M. Bounakhla, K. Embarch, F. Zahry, E. Bilal and P. Kump, J. Radioanal. Nucl. Chem., 275, 467-478(2008).
11. C. Vanhoof, V. Corthouts and K. Tirez, J. Environ. Monit., 6, 344-350(2004).
12. M. Pouzar, T. Cernohorsky, A. and Krejcova, Talanta, 54, 829-835(2001).
13. M. O. Stallard, S. E. Apitz and C. A. Dooley, Mar. Pollut. Bull., 31, 297-305(1995).
14. S. J. Goldstein, A. K. Slemmons and H. E. Canavan, Environ. Sci. Technol., 30, 2318-2321(1996).
15. S. J. Choi, C. H. Kim and S. G. Lee, Anal. Sci & Tech., 22(4), 293-301(2009).
16. S. J. Choi, C. H. Kim, S. G. Lee and D. P. Kim, Anal. Sci & Tech., 22(5), 422-431(2009).
17. D. J. Kalnickya and R. Singhvi and J. Hazard. Mater., 83, 93-122(2001).
18. J. Enzweiler and M. A. Vendemiatto, Geostandards and Geoanalytical Research, 28, 103-112(2004).
19. V. Ya. Borkhodoev, X-ray Spectrom., 31, 209-218(2002).