- P-ISSN 1225-0163
- E-ISSN 2288-8985
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- P-ISSN1225-0163
- E-ISSN2288-8985
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Development of the Ion Source of Glow Discharge/Mass Spectrometry for the determination of trace elements
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1992, v.5 no.2, pp.169-176
Woo,
J. C., Lim,
H. B., Moon,
D. W., Lee,
K. W., &
Kim,
H.
J.
(1992). Development of the Ion Source of Glow Discharge/Mass Spectrometry for the determination of trace elements. Analytical Science and Technology, 5(2), 169-176.
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Abstract
Analytical detection limits and Relative Ion Yield (RIY) by a jet type ion source glow discharge mass spectrometer(GD/MS) have been measured. With a jet type ion source, the sample loss rate for a Cu sample is 0.23 mg/min with 0.1 L/min gas flow rate and 0.11 mg/min with no gas flow rate. However, the ion intensity of Cu does not change significantly with thee variation of the gas flow rate. The RIY values obtained from the calibration curves of the six copper based standards were between 0.57 of Fe and 3.5 of Cr. The detection limits of most elements were in the range of 0.9 and 2.0 ppm when the glow discharge was operated at 4 mA, 1000V.
- keywords
- GD/MS, Jet type ion source, Grimm type ion source, Flat type sample
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