- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
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Principle and Applications of Atomic Force Microscope & Scanning Tunneling Microscope
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1996, v.9 no.3, pp.1069-1075
Kim,
P.
(1996). Principle and Applications of Atomic Force Microscope & Scanning Tunneling Microscope. Analytical Science and Technology, 9(3), 1069-1075.
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