- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
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The Studies of Conductive and Non-Conductive Multi-Layer Depth Analysis by Radio Frequency Gas-Jet Boosted Glow Discharge Atomic Emission Spectrometry
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
2002, v.15 no.3, pp.7-242
&
(2002). The Studies of Conductive and Non-Conductive Multi-Layer Depth Analysis by Radio Frequency Gas-Jet Boosted Glow Discharge Atomic Emission Spectrometry. Analytical Science and Technology, 15(3), 7-242.
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Abstract
method was investigated to determine the thickness of coating on steel sheet using rf glow discharge atomic emission spectrometer. The RF gas-jet boosted glow discharge has such salient feature as good pleasure stability and high sputtering efficiency that it was possible to determine the thickness of silicon resin film on zinc electroplated steel. The erosion speed variation is dependent on discharge power, gas flow rate and discharge pressure. therefore determine discharge condition to measure the thickness of coating on steels. The fundamental studies have been carried out to investigate&enote;
- keywords
- RF gas-jet boosted nozzle, Depth profiling, atomic emission sepctrometry
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