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- E-ISSN 2288-8985
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Modification of conventional X-ray diffractometer for the measurement of phase distribution in a narrow region
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
2006, v.19 no.5, pp.407-414
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(2006). Modification of conventional X-ray diffractometer for the measurement of phase distribution in a narrow region. Analytical Science and Technology, 19(5), 407-414.
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Abstract
An X-ray diffractometer for spatially resolved X-ray diffraction measurements was developed to identify phase in the narrow (micron-scaled) region of high burn-up fuels and some nuclear materials. The micro-XRD was composed of an X-ray microbeam alignment system and a sample micro translation system instead of a normal slit and a fixed sample stage in a commercial XRD. The X-ray microbeam alignment system was fabricated with a microbeam concentrator having two Ni deposited mirrors, a vertical positioner, and a tilt table for the generation of a concentrated microbeam. The sample micro translation system was made with a sample holder and a horizontal translator, allowing movement of a specimen at <TEX>$5{\mu}m$</TEX> steps. The angular intensity profile of the microbeam generated through a concentrator was symmetric and not distorted. The size of the microbeam was <TEX>$4,000{\times}20{\mu}m$</TEX> and the spatial resolution of the beam was <TEX>$47{\mu}m$</TEX> at the sample position. When the diffraction peaks were measured for a <TEX>$UO_2$</TEX> pellet specimen by this system, the reproducibility (<TEX>$2{\Theta}
- keywords
- micro X-ray diffraction, microbeam concentrator, narrow region, interface
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