- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
Article Detail
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A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA)
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
2000, v.13 no.5, pp.565-572
Park,
S. D., Ha,
Y. K., Kim,
J. G., Jee,
K. Y., &
Kim,
W.
H.
(2000). A Study on the Standards for Xe Analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analysis (EPMA). Analytical Science and Technology, 13(5), 565-572.
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Abstract
In this paper it was described on the standards for Xe analysis by Wavelength Dispersive X-ray Spectrometer (WDS) of Electron Probe Micro Analyser. According to the experimental results, CsI and <TEX>$BaCO_3$</TEX> are appropriate compounds as standard specimen for Cs, I and Ba which has not suitable pure metal standards. In the beam current of 10-30 nA range, the Cs x-ray intensity measured from CsBr and CsI was proportional to the beam current. It was found that the linear regression factor R, showing the linearity between the atomic number and x-ray intensity between In and Nd elements, was higher than 0.99 at 25 kV and PET crystal. The caJlculated x-ray intensity of Xe standard from this linear regression equation was 1.095 times higher than that ofTe at 25 kV.
- keywords
- EPMA, WDS, Xe
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