Confirmation of reterence value using uncertainty of multiple measurements

최종오; 소헌영; 우진춘; 황의진

권한신청
P-ISSN1225-0163
E-ISSN2288-8985
SCOPUS, ESCI, KCI

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P-ISSN 1225-0163
E-ISSN 2288-8985

논문 투고

15권 6호

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반복측정의 불확도를 이용한 인증값 확인

Confirmation of reterence value using uncertainty of multiple measurements

분석과학 / Analytical Science and Technology, (P)1225-0163; (E)2288-8985

2002, v.15 no.6, pp.580-583

최종오 (한국표준과학연구원)
소헌영 (한국표준과학연구원)
우진춘 (한국표준과학연구원)
황의진 (한국표준과학연구원)

최종오, 소헌영, 우진춘, & 황의진. (2002). 반복측정의 불확도를 이용한 인증값 확인. 분석과학, 15(6), 580-583.

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Abstract

New approach is developed employing the overall uncertainty obtained from multiple measurements to evaluate the statistical significance for the difference between a given reference value and its measured value determined in a lab. The overall uncertainty is determined by separate combinations of the uncertainties arising from systematic and random effects. It is shown that the uncertainty term in regular t-test can be underestimated by n measurements.