- P-ISSN 1225-0163
- E-ISSN 2288-8985
- P-ISSN1225-0163
- E-ISSN2288-8985
- SCOPUS, ESCI, KCI
Article Detail
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Measurment of Gold Coating Thickness by PIXE
Analytical Science and Technology / Analytical Science and Technology, (P)1225-0163; (E)2288-8985
1994, v.7 no.4, pp.471-476
Kim,
N., Woo,
H., Kim,
Y., Kim,
D., Kim,
J., Choi,
H., &
Park,
K.
(1994). Measurment of Gold Coating Thickness by PIXE. Analytical Science and Technology, 7(4), 471-476.
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Abstract
The capability of PIXE (Proton Induced X-ray Emission) method for the precision measurement of coating thickness has been tested by measuring several gold coated copper plates. Two different experimental methods are applied and compared. The results are compared with those by the weight measurement and proton RBS (Rutherford Backscattering Spectrometry). The advantage of the method is that it can be also used for the nondestructive thickness measurement of this layers on large-scaled samples or archeological samples which cannot be placed in a vacuum chamber.
- keywords
- PIXE, proton BS, gold coating, nondestructive thickness measurement, stopping power, X-ray absorption
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